Scanning Electron Microscopy (SEM)

SEM works by directing a beam of electrons over the surface of a specimen, producing signals that are collected to form detailed images and, in some configurations, provide compositional information. Capable of magnifications far beyond those of optical microscopes, SEM is used to study surface topography, morphology, and material composition across numerous scientific and industrial fields.

• Ultra-high resolution imaging of surface structures

• Exceptional depth of field for detailed 3D-like images

• Capable of micro- to nanoscale analysis

• Can be combined with Energy-Dispersive X-ray Spectroscopy (EDS) for elemental composition

• Suitable for metals, polymers, ceramics, biological specimens, and more

• Non-destructive imaging for many sample types

• Widely used in materials science, electronics, forensics, life sciences, and industrial quality control