Atomic Force Microscopy (AFM)

AFM uses a cantilever with a nanoscale tip to physically interact with a sample surface. As the tip moves across the surface, deflections in the cantilever are measured to generate a 3D map of the sample’s topography. Depending on the operating mode, AFM can also measure forces, stiffness, adhesion, and other nanoscale properties. Its ability to operate in air, liquid, or controlled environments makes it indispensable in materials science, nanotechnology, biology, and electronics research.

• Nanoscale resolution for detailed surface characterization

• Generates true 3D topographical maps of surfaces

• Can measure mechanical, adhesive, and electrical properties

• Minimal or no sample preparation required

• Operates in air, liquid, or vacuum environments

• Non-destructive for many delicate and soft samples

• Widely used in materials research, nanofabrication, life sciences, and semiconductor analysis