X-ray Diffraction (XRD)

XRD uses the interaction of X-rays with the atomic planes in crystalline materials to determine their structural properties. It provides accurate information on phase identification, crystallinity, lattice parameters, and more, making it an indispensable tool for materials science, geology, pharmaceuticals, and industrial quality control.

• Non-destructive analysis of crystalline materials
• Accurate phase identification and quantification
• Determination of lattice parameters, crystallite size, and strain
• High-resolution data for complex multiphase samples
• Suitable for powders, thin films, and bulk materials
• Fast, automated measurements for high throughput
• Applications include geology, materials science, pharmaceuticals, and manufacturing quality control